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Series on Quality, Reliability and Engineering Statistics - Vol. 4
FRONTIERS IN RELIABILITY
edited by Asit P Basu (University of Missouri-Columbia, USA), Sujit K Basu (Indian Institute of Management, India) & Shyamaprasad Mukhopadhyay (Calcutta University, India)
This volume presents recent results in reliability theory by leading experts in the world. It will prove valuable for researchers, and users of reliability theory. It consists of refereed invited papers on a broad spectrum of topics in reliability. The subjects covered include Bayesian reliability, Bayesian reliability modeling, confounding in a series system, DF tests, Edgeworth approximation to reliability, estimation under random censoring, fault tree reduction for reliability, inference about changes in hazard rates, information theory and reliability, mixture experiment, mixture of Weibull distributions, queuing network approach in reliability theory, reliability estimation, reliability modeling, repairable systems, residual life function, software spare allocation systems, stochastic comparisons, stress-strength models, system-based component test plans, and TTT-transform.
Contents:
- A Bayesian Approach Using Nonhomogeneous Poisson Processes
for Software Reliability Models (J A Achcar et al.)
- Recent Applications of the Plotting Technique (B Bergman & B Klefsjö)
- On Smoothed Functional Estimation Under Random Censoring (Y P Chaubey & P K Sen)
- Applications of Higher Order Moments and the Edgeworth Approximation to Reliability and Life Testing (A Childs & N Balakrishnan)
- Inference About Sharp Changes in Hazard Rates (J K Ghosh et al.)
- Parametric Random Effects Models Based on the Exponential and Weibull Distributions (A C Kimber & C-Q Zhu)
- Mixture of Weibull Distributions — Parametric Characterization of Density Function (D N P Murthy & R Jiang)
- Statistical Approaches to Modeling and Estimating Software Reliability (T K Nayak)
- Parameter Estimation in Software Reliability Growth Models (L D Ries & A P Basu)
- Ordinary and Bayesian Approach to Life Testing Using the Extreme Value Distribution (C P Tsokos)
- Fault Tree Reduction for Reliability Analysis and Improvement (M Xie et al.)
- and other papers
Readership: Engineers, statisticians, graduate students and
researchers in reliability theory.
| 448pp (approx.) |
Pub. date: Aug 1998 |
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