Selected Topics in Electronics and Systems - Vol. 34
RADIATION EFFECTS AND SOFT ERRORS IN INTEGRATED CIRCUITS AND ELECTRONIC DEVICES
edited by R D Schrimpf & D M Fleetwood (Vanderbilt University, USA)
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal–oxide– semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.
Contents:
- Single Event Effects in Avionics and on the Ground (E Normand)
- Soft
Errors in Commercial Integrated Circuits (R C Baumann)
- System Level Single Event Upset Mitigation Strategies (W F Heidergott)
- Space Radiation Effects in Optocouplers (R A Reed et al.)
- The Effects of Space Radiation Exposure on Power MOSFETs: A Review (K Shenai et al.)
- Total Dose Effects in Linear Bipolar Integrated Circuits (H J Barnaby)
- Hardness Assurance for Commercial Microelectronics (R L Pease)
- Switching Oxide Traps (T R Oldham)
- Online and Realtime Dosimetry Using Optically Stimulated Luminescence (L Dusseau & J Gasiot)
- and other articles
Readership: Practitioners, researchers, managers and graduate students in
electrical and electronic engineering, semiconductor science and technology, and microelectronics.
"Ron Schrimpf and Dan Fleetwood are world renowned experts in radiation effects. They have put together a winning team of experienced authors to explain the nature and implications of transient and permanent radiation damage resulting from ionizing particles. This book is a great resource for the practicing engineer or beginner who wants to understand whether modern devices, circuits, and systems will survive in radiation environments. One thing is for certain — radiation damage will become increasingly important as device geometries shrink and stored information is but a few electrons.”
Dr Peter S Winokur
Sandia National Laboratories |
| 348pp |
Pub. date: Aug 2004 |
|
