edited by Lim Hock (National University of Singapore, Singapore) , Serguei Matitsine (National University of Singapore, Singapore) , & Gan Yeow Beng (National University of Singapore, Singapore)

This volume comprises the main ideas and the latest results in the study of electromagnetic materials, as presented at the Symposium on Electromagnetic Materials, ICMAT 2005.

The high quality contributions reflect the principle aims of the conference: to provide an international forum for scientists and engineers to report their most recent research findings, to exchange ideas and information, and to nuture and establish research ties. Electromagnetic materials have both civilian and defence applications, such as novel antenna designs, protection against high power transients in densely packed printed circuits, and special frequency response or polarization response to meet component or system specifications. An in-depth understanding of the responses of materials to electromagnetic waves may even enable us to design and fabricate materials with properties not found in nature.

• Metamaterials: From Averaging to Detailed Electrodynamic Description (A N Lagarkov & V N Kissel)
• Electromagnetic Field Energy Density in Dispersive and Lossy Metamaterials (S A Tretyakov)
• Electromagnetic Metamaterials over the Whole THz Range — Achievements and Perspectives (H O Moser et al.)
• Superlens as Matching Device (V G Veselago)
• Theory of Negative Refraction and Left-Handed Metamaterials (LHM) (J A Kong et al.)
• Thin Ferromagnetic Film-Based Two-Dimensional Magnonic Crystals (S A Nikitov et al.)
• Giga-Hertz Conducted Noise Suppressors of Ferrite Films Prepared from Aqueous Solution (M Abe et al.)
• Recent Developments in the Field of Frequency/E-Field Agile Microwave Electronics (FAME) (A S Bhalla)
• Tunable Microwave Ceramic Thick Films (X Yao)
• Sculptured Thin Films (A Lakhtakia)
• Recent Advances in Microwave Magnetic Materials (O Acher)
• Active Absorber Research at The University of Sheffield (A Tennant & B Chambers)
• Correcting for Imperfections in the Experimental Characterization of Dielectric Media for High-Precision Metrology (L R Arnaut)
• and other papers