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APPLIED CRYSTALLOGRAPHY
Proceedings of the XIX Conference
Kraków, Poland 1 - 4 September 2003
edited by Henry Morawiec & Danuta Stróz (University of Silesia, Poland)
This book aims to propagate the newest achievements of applied crystallography among crystallographers, solid state physicists and materials scientists. It presents application of structural studies to materials used in industrial practice rather than those associated with the crystal structure determination only.
The proceedings have been selected for coverage in:
• Materials Science Citation Index®
• Index to Scientific & Technical Proceedings® (ISTP® / ISI Proceedings)
• Index to Scientific & Technical Proceedings (ISTP CDROM version / ISI Proceedings)
• CC Proceedings — Engineering & Physical Sciences
Contents:
- Ultra High Angle Double-Crystal X-Ray Diffractometry
(U-HADOX) (A Okazaki & K Munakata)
- Microstructure and Lattice Defect Analysis of Highly Deformed Materials by XRD Line Profile Modelling (P Scardi)
- Beyond the Ability of Rietveld Analysis: Whole-Pattern Fitting Based on the Maximum-Entropy Method (F Izumi)
- Six-Dimensional Texture Analysis with High-Energy Synchrotron Radiation (H J Bunge)
- Present State of Knowledge on Quasicrystals (W Steurer)
- and other papers
Readership: Graduate students, academics and researchers in applied
crystallography and materials science.
| 440pp |
Pub. date: Apr 2004 |
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