by Antonio Cricenti (Istituto di Struttura della Materia, Italy) & Giorgio Margaritondo (Ecole Politechnique Federale de Lausanne, Switzerland)

Table of Contents (61k)
Preface (164k)
Chapter 1: Adsorption of Cyclopentene on GaAs(00l) and InP(00l), A Comparative Study by Synchrotron-Based Core Level Spectroscopy (431k)

The book's objective is to present the capabilities of state-of-the-art synchrotron radiation and scanning probe microscopy techniques, together with general theory work, in elucidating the fundamental electronic and structural properties of semiconductor and metal surfaces, interfaces, nanostructures, layers and diverse biological systems.

• Adsorption of Cyclopentene on GaAs(001) and InP(001), a Comparative Study by Synchrotron-Based Core Level Spectroscopy (R Passmann et al.)
• Time Resolved Energy Dispersive X-Ray Reflectometry as a Tool for Material Science Studies: The Case of Organic Solar Cells (B Paci et al.)
• Novel Oxidation Process on Chiral Silicon Nanowires (P De Padova et al.)
• Localization and Diffusive Processes in the Electronic Transport in Quasi One-Dimensional Nanostructures (F Flores et al.)
• Optical and Electron Energy Loss Spectra of Liquid Water: An Ab-Initio Study (O Pulci et al.)
• Microradiology Imaging of the Biodistribution of Polyethylene Glycol (PEG) Modified Gold Nanoparticles in Cancer Bearing Mice (C-C Chien et al.)
• Development of Scanning Probe Microscopy Electronic Control at ISM (M Luce et al.)
• Nanostructures Induced by the Absorption of Fullerenes: Structural and Electronic Properties (R Felici & M Pedio)
• and other papers