Series on Advances in Mathematics for Applied Sciences - Vol. 53
ADVANCED MATHEMATICAL AND COMPUTATIONAL TOOLS IN METROLOGY IV
edited by P Ciarlini (CNR, Roma, Italy), A B Forbes (National Physical Laboratory, Teddington, UK), F Pavese (CNR, Torino, Italy) & D Richter (Physikalisch-Technische Bundesanstalt, Berlin)
Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, are likely to benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes.
This book is of interest to people in universities, research centers and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and to those developing such mathematical tools.
Contents:
- An Efficient Algorithm for Template Matching (I J Anderson et al.)
-
An Application of Bootstrap Regression to Metrological Data with Errors in Both Variables (P Ciarlini & G Regoliosi)
- Evaluation of Lateral Shearing Interferograms (C Elster)
- Fusing Prior Calibration Information in Metrology Data Analysis (A B Forbes)
- Software Engineering Related Standards and Guidelines for Metrology (N Greif & D Richter)
- Virtual Testing: Interaction with a Composite Model Using the Internet (N J McCormick)
- Mathematical Problems in the Definition of Standards Based on Scales: The Case of Temperature (F Pavese)
- Discussion of Methods for the Assessment of Uncertainties in Monte Carlo Particle Transport Calculations (B R L Siebert)
- Some Robust Methods for Fitting Parametrically Defined Curves or Surfaces to Measured Data (G A Watson)
- and other papers
Readership: Researchers in metrological institutes, universities (measurement
science and industries (quality systems, calibration, certification).
| 336pp |
Pub. date: Jan 2000 |
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