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    ADVANCES IN MULTIPHYSICS SIMULATION AND EXPERIMENTAL TESTING OF MEMS

    edited by Attilio Frangi (Politecnico di Milano, Italy), Carlo Cercignani (Politecnico di Milano, Italy), Subrata Mukherjee (Cornell University, USA), & Narayan Aluru (University of Illinois at Urbana Champaign, USA)

    Table of Contents (81k)
    Preface (100k)
    Chapter 1: Challenges in Modeling Liquid and Gas Flows in Micro/Nano Devices (479k)

    This volume takes a much needed multiphysical approach to the numerical and experimental evaluation of the mechanical properties of MEMS and NEMS. The contributed chapters present many of the most recent developments in fields ranging from microfluids and damping to structural analysis, topology optimization and nanoscale simulations. The book responds to a growing need emerging in academia and industry to merge different areas of expertise towards a unified design and analysis of MEMS and NEMS.

     
    Contents:
    • Challenges in Modeling Liquid and Gas Flows in Micro/Nano Devices (M Gad-el-Hak)
    • Using the Kinetic Equations for MEMS and NEMS (C Cercignani et al.)
    • Applying the Direct Simulation Monte Carlo (DSMC) Method to Gas-Filled MEMS Devices (M A Gallis)
    • New Approaches for the Simulation of Microfluidics in MEMS (T Y Ng et al.)
    • Evaluating Gas Damping in MEMS Using Fast Integral Equation Solvers (A Frangi et al.)
    • Experimental Techniques for Damping Characterization of Micro and Nanostructures (A Bosseboeuf & H Mathias)
    • Nonlinear Dynamics of Electrostatically Actuated MEMS (S K De & N Aluru)
    • Coupled Deformation Analysis of Thin MEMS Plates (S Mukherjee & S Telukunta)
    • Pull-In Instability in Electrostatically Actuated MEMS Due to Coulomb and Casimir Forces (R C Batra et al.)
    • Numerical Simulation of BioMEMS with Dielectrophoresis (G R Liu & C X Song)
    • Continuous Modeling of Multi-Physics Problems of Microsystems for Topology Optimization (G K Ananthasuresh)
    • Mechanical Characterization of Polysilicon at the Micro-Scale Through On-Chip Tests (A Corigliano et al.)
    • Nano-Scale Testing of Nanowires and Carbon Nanotubes Using a Micro-Electro-Mechanical System (H D Espinosa et al.)
     
    Readership: Postgraduate students, researchers and scientists in academia and the MEMS/NEMS industry.
     
    “This book would be of interest to those in academic or industrial research that model MEMS devices. The book will provide some of the latest methods used to model these devices along with some experimental methods used to characterize MEMS.”
    IEEE Electrical Insulation Magazine
     
    504pp    Pub. date: Jul 2008  
    ISBN:   978-1-86094-862-6
    1-86094-862-6
       US$205 / £135
    US$144 / £95
    30% OFF until 15 Feb 2012

     


    504pp    Pub. date: Jul 2008  
    ISBN:   978-1-86094-863-3(ebook)
    1-86094-863-4(ebook)
       US$267 / £176
    US$187 / £123
    30% OFF until 15 Feb 2012

     


     

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    Updated on 3 February 2012